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X-ray Detector / Silicon Drift

X-ray detector / silicon drift

20 - 150 mm² | X-MaxN

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X-ray detector / silicon drift
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    X-ray, silicon drift

The x-act is a fully quantitative SDD with excellent performance at low and high count rates. It provides all the benefits of Oxford Instruments’ renowned technology in a package that is suitable for applications that do not demand the full performance of the large area X-MaxN detectors.

x-act incorporates 40 years of Oxford Instruments’ expertise,and is backed up by worldwide sales, service and customer
support specialists.

Overview
Detects elements from Be to Pu
Premium resolution of 125 eV available, guaranteed on your SEM
Resolution measured in compliance with ISO 15632:2012
Compatible with INCA® and AZtec® EDS analysis software

View catalogue Go to the Oxford Instruments - NanoAnalysis website for more information
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